Scanning Electron Microscope SEM

Scanning Electron Microscope Jeol JSM-6700F

Typ JSM 6700F Scanning Electron Microscope high resolution with a cold field emission source range: 0.5 - 30 kV with a resolution of 1.2nm at 15 kV and 2.5nm at 1 kV. A secondary electron detector is integrated into the bore of the lens and the specimen can be brought up into the lens field Working distance: as low as 2mm Second conventional secondary electron detector, which gives more topographic images. Magnifications of 25x to 650,000x (at 8mm working distance) EDX system is also included.